| |
|
No |
Instruments
|
Internal
Fee
|
Location |
Contact person |
|
$/hour |
$/Year* |
|
Organic
Analysis |
|
1 |
Purge &
Trap/GC(PID/ELCD), EzChrom Chromatography Data system |
16 |
3200 |
YCEES, 213 |
L. Krishtopa |
|
2 |
GC(FID)
HP, Thermal Desorber, EzChrom Chromatography Data system |
11 |
2200 |
YCEES, 213 |
L. Krishtopa |
|
3 |
GC(two
FIDs), HP + HP Autosampler, EzChrom Chromatography Data
system |
11 |
2200 |
YCEES, 213 |
L. Krishtopa |
|
4 |
GC(FID,TCD), HP + Optic-2 Injector + Autosampler
(Liquid/Headspace), EzChrom Chromatography Data system |
15 |
3000 |
YCEES, 213 |
L. Krishtopa |
|
5 |
GC(FID,TCD), HP + LEAP Autosampler (Liquid/Headspace),
EzChrom Data system |
13 |
2600 |
YCEES, 213 |
L. Krishtopa |
|
6 |
GC(two
ECDs), Varian 3400 + CTC Autosampler, EzChrom Data
system |
12 |
2400 |
YCEES, 213 |
L. Krishtopa |
|
7 |
GC(two
FIDs, TCD), Varian 3600, EzChrom Chromatography Data
system |
10 |
2000 |
YCEES, 213 |
L. Krishtopa |
|
8 |
Gow-Mac
GC (TCD)/6-port Gas Sampling Valve (Manual Injection),
EzChrom Data system |
9 |
1800 |
Colton Hall |
L. Krishtopa |
|
9 |
Agilent
GC/MS (Quadrupole)/AED + HP Autosampler |
30 |
6000 |
YCEES, 213 |
L. Krishtopa |
|
10 |
Agilent
GC/MS (Quadrupole) + HP Autosampler |
22 |
4400 |
YCEES, 213 |
L. Krishtopa |
|
11 |
Agilent
GC/AED + HP Autosampler |
19 |
3800 |
YCEES, 213 |
L. Krishtopa |
|
12 |
HP GC/MS
(Quadrupole) + HP Autosampler |
19 |
3800 |
Colton Hall |
L. Krishtopa |
|
13 |
Mattson
FTIR |
11 |
2200 |
Colton Hall |
J. Shim |
|
14 |
Agilent
UV/Visible Spectrophotometer + Chemstation Software |
9 |
450 |
YCEES 211 |
L. Krishtopa |
|
15 |
Fluorescence Spectrophotometer |
10 |
500 |
YCEES, 213 |
L. Krishtopa |
|
16 |
HPLC(UVD)
#1 (Alliance Separation Module), EzChrom Data system |
14 |
2800 |
YCEES, 211 |
L. Krishtopa |
|
17 |
HPLC(UVD)
#2 + HP Autosampler, EzChrom Chromatography Data system |
14 |
2800 |
YCEES, 211 |
L. Krishtopa |
|
18 |
HPLC(PDA)
#3 + Waters Autosampler, Millennium Chromatography Data
system |
15 |
3000 |
YCEES, 211 |
L. Krishtopa |
|
19 |
HPLC(Dual
UV) #4 + Waters Autosampler, EzChrom Data system |
14 |
2800 |
YCEES, 213 |
L. Krishtopa |
|
20 |
HPLC(UV)
#5 + Waters Autosampler, EzChrom Chromatography Data
system |
14 |
2800 |
YCEES, 213 |
L. Krishtopa |
|
21 |
ThermoFinnigan LC/MS (ion trap) |
33 |
6600 |
YCEES, 211b |
L. Krishtopa |
|
22 |
ThermoFinnigan LC system /PDA |
20 |
4000 |
YCEES, 211b |
L. Krishtopa |
|
23 |
TOC
Analyzer (Teckmar-Dohrman) |
11 |
2200 |
YCEES, 211 |
L. Krishtopa |
|
Inorganic
Analysis |
|
24 |
PE AA
Spectrometer, Flame3 |
12 |
2400 |
YCEES, 119 |
J. Shim |
|
25 |
PE AA
Spectrometer, Fraphite Furnace + Autosampler3 |
13 |
2600 |
Colton Hall |
J. Shim |
|
26 |
Agilent
ICP-MS** |
32 |
6400 |
YCEES, 209 |
L. Krishtopa |
|
27 |
Microwave
Oven3 |
10 |
2000 |
YCEES, 117 |
L. Krishtopa |
|
28 |
Ion
Chromatograph (CD, UVD) + Waters Autosampler, EzChrom
Data system |
12 |
2400 |
YCEES, 211 |
L. Krishtopa |
|
29 |
Dionex
Ion Chromatograph (CD) + EzChrom Chromatography Data
system |
10 |
2000 |
YCEES, 211 |
L. Krishtopa |
|
30 |
Niton
Portable XRF Analyzer |
12 |
2400 |
YCEES, 213 |
J. Shim |
|
31 |
Philips
X-ray Fluorescence Spectrometer (XRF) |
33 |
4950 |
Colton Hall |
J. Shim |
|
Structural
Analysis |
|
32 |
Philips
X-ray Difractometer (XRD) |
18 |
2700 |
Colton Hall |
J. Shim |
|
33 |
LEO FESEM |
40 |
10000 |
YCEES, 104 |
X. Zhang |
|
34 |
Atomic
Force Microscope |
30 |
4500 |
YCEES, 303 |
X. Zhang |
|
35 |
Scanning
Near Field Optical Microscope |
34 |
5100 |
YCEES, 303 |
X. Zhang |
Sample Preparation
Equipment for SEM/TEM/AFM***
|
|
36 |
Ion
Mill
|
11 |
2200 |
YCEES, 106 |
X. Zhang |
|
37 |
Plasma
Cleaner
|
10 |
2000 |
YCEES, 106 |
X. Zhang |
|
38 |
Ultrasonic Disk Cutter
|
7 |
1400 |
YCEES, 106 |
X. Zhang |
|
39 |
Electropolisher
|
7 |
1400 |
YCEES, 106 |
X. Zhang |
|
40 |
Dimpling Grinder
|
7 |
1400 |
YCEES, 106 |
X. Zhang |
|
41 |
Coating
System
|
10 |
2000 |
YCEES, 106 |
X. Zhang |
|
42 |
Ultramicrothome
|
13 |
2600 |
YCEES, 106 |
X. Zhang |
|
43 |
Polisher2
|
8 |
1700 |
YCEES, 303 |
X. Zhang |
|
Particle
Characterization |
|
44 |
Particle
Counters, LS2301 |
25 |
2800 |
YCEES, 303 |
X. Zhang |
|
45 |
Particle
Counters, N4+1 |
25 |
2200 |
YCEES, 303 |
X. Zhang |
|
Miscellaneous |
|
46 |
Dielectric Spectrometer |
35 |
5250 |
YCEES, 303 |
X. Zhang |
|
47 |
High-Speed Centrifuge1 |
12 |
2400 |
Colton Hall |
J. Shim |
|
48 |
Microtox
Toxicity Analyzer |
10 |
2000 |
Colton Hall |
J. Shim |
|
49 |
BET |
13 |
2600 |
YCEES, 117 |
X. Zhang |
|
50 |
CHNS/O
Analyzer |
13 |
2600 |
Colton Hall |
J. Shim |
|
51 |
TGA3 |
12 |
2420 |
YCEES, 213 |
L. Krishtopa |
|
| |
* Allows unlimited use of
instrumentation
** Minimum charge - 2 hours
*** Minimum charge - $5
1
Minimum charge – 1/2 hour
2
Supplies: $20-30 depending on sample
3
Minimum charge – 1 hour
ADDITIONAL labor charge
($40/hour) will be applied in the following cases:
(a)
For all the first time instrument users, assuming
that the students must receive initial instrument training (at
least, one hour, depending upon the complexity of the
instrument/method);
(b)
When Analytical Lab
provides complete sample analysis without involving client (actual
time spent by lab technician for the sample preparation
and analysis plus any additional charge for supplies and
chemicals).
|
| |
Seed Fund Grant
The NJIT Materials Characterization
Laboratory provides a wide range of analytical and
characterization equipment for supporting and advancing
research by faculty and students. The University provides a
significant level of financial support for the operation and
maintenance of the Laboratory in order to keep the research
resource staffed and ready for use. The operation of the
Laboratory also depends on fee payments by users based on
grants and contracts obtained for research support. It is
also recognized that successful grant applications may be
based on the ability to demonstrate a proof of principle or
initial research results. Obtaining this type of information
may benefit from use of the Materials Characterization
facilities. The University has developed a mechanism to
provide small amounts of funds to provide for access to the
laboratory to obtain these initial results. It is expected
that researchers who apply for these seed grants will
describe the work to be done and estimate the cost based on
the Material Characterization Laboratory fee schedule. In
addition, the application should describe the planned use
for the results of the seed study, such as which proposals
will be prepared and submitted.
The proposals for seed funding will be
evaluated. Verification will be made that no alternative
funding mechanism exists. A copy of the proposal written
using the results of the laboratory effort will also be
required when it is prepared. There may be some exceptional
other uses of the seed funds, such as need for a student to
complete dissertation research. Such cases will be
considered. There should be no assumption of automatic
funding using this mechanism.
Please Click here to download the Seed Fund Grant
Application
(PDF Document).
|
|
|
